Invention Grant
- Patent Title: Processing apparatus and cleaning processing method
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Application No.: US17964554Application Date: 2022-10-12
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Publication No.: US12017261B2Publication Date: 2024-06-25
- Inventor: Tomoya Hasegawa , Masaki Kurokawa , Masami Oikawa
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Venjuris, P.C.
- Priority: JP 21171169 2021.10.19
- Main IPC: B08B9/08
- IPC: B08B9/08 ; B08B13/00 ; C23C16/42 ; C23C16/44 ; H01J37/32

Abstract:
A processing apparatus includes: a processing container; a temperature sensor that detects a temperature therein; a gas supply unit that supplies a cleaning gas into the processing container; a pressure regulation unit that regulates a pressure in the processing container; and a control unit that controls the gas supply unit and the pressure regulation unit to perform a cleaning processing of removing a deposited film in the processing container. The control unit stores a vapor pressure curve in which the temperature in the processing container is associated with a vapor pressure of water in the processing container. In the cleaning processing, the control unit sets a target pressure below the vapor pressure curve based on the temperature detected by the temperature sensor and the vapor pressure curve, and controls the pressure regulation unit such that the pressure in the processing container becomes the target pressure.
Public/Granted literature
- US20230124143A1 PROCESSING APPARATUS AND CLEANING PROCESSING METHOD Public/Granted day:2023-04-20
Information query
IPC分类: