Embodiments of the present disclosure provide a memory test method and a device thereof, an electronic device, and a computer-readable storage medium, which relate to the field of semiconductor device testing technologies. The method is executed by a built-in self-test circuit and includes: acquiring defect information of a first memory by testing the first memory; acquiring repair information of the first memory based on the defect information of the first memory; and storing the repair information of the first memory in a second memory.