A system for inspecting a reflective surface includes a first imaging assembly configured to take a first image of the reflective surface. The first image includes depth information. The system also includes a second imaging assembly configured to take a second image of the reflective surface. The second image includes contrast information. The system further includes a processor configured to acquire the first image and the second image, estimate a depth profile of the surface based on the depth information, correlate the depth profile with the second image, and identify a feature of the reflective surface based on the correlation.