发明授权
- 专利标题: Identify the programming mode of memory cells during reading of the memory cells
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申请号: US18189824申请日: 2023-03-24
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公开(公告)号: US12080359B2公开(公告)日: 2024-09-03
- 发明人: Karthik Sarpatwari , Fabio Pellizzer , Nevil N. Gajera
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Greenberg Traurig
- 主分类号: G11C7/00
- IPC分类号: G11C7/00 ; G11C16/10 ; G11C16/26 ; G11C16/30 ; G11C16/34
摘要:
Systems, methods and apparatus to determine a programming mode of a set of memory cells that store an indicator of the programming mode. In response to a command to read the memory cells in a memory device, a first read voltage is applied to the memory cells to identify a first subset of the memory cells that become conductive under the first read voltage. The determination of the first subset is configured as an operation common to different programming modes. Based on whether the first subset of the memory cell includes one or more predefined memory cells, the memory device determines a programming mode of memory cells. Once the programming mode is identified from the common operation, the memory device can further execute the command to determine a data item stored, via the programming mode, in the memory cells.
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