- 专利标题: Manufacturing method of semiconductor structure and semiconductor structure
-
申请号: US17454871申请日: 2021-11-15
-
公开(公告)号: US12080758B2公开(公告)日: 2024-09-03
- 发明人: Weichao Zhang
- 申请人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 申请人地址: CN Hefei
- 专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人地址: CN Hefei
- 代理机构: Kilpatrick Townsend & Stockton LLP
- 优先权: CN 2110291828.7 2021.03.18
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L21/02 ; H01L21/321 ; H01L21/764 ; H10B12/00
摘要:
The present disclosure provides a manufacturing method of a semiconductor structure and a semiconductor structure. The manufacturing method of a semiconductor structure includes: providing a substrate, the substrate includes active regions and isolation regions, each of the isolation regions includes a first trench and an isolation layer formed in the first trench; removing part of the isolation layer to form first grooves; forming a first mask layer, the first mask layer covers upper surfaces of the active regions and fills the first grooves; planarizing the first mask layer, such that an upper surface of a portion of the first mask layer located above the active regions is flush with an upper surface of a portion of the first mask layer located above the isolation regions; removing part of the first mask layer, part of the isolation layer, and part of the substrate, to form second trenches and third trenches.
公开/授权文献
信息查询
IPC分类: