Invention Grant
- Patent Title: Reduction of cracks in passivation layer
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Application No.: US17589500Application Date: 2022-01-31
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Publication No.: US12087714B2Publication Date: 2024-09-10
- Inventor: Kuo-An Liu , Wen-Chiung Tu , Yuan-Yang Hsiao , Kai Tak Lam , Chen-Chiu Huang , Zhiqiang Wu , Dian-Hau Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L23/00
- IPC: H01L23/00

Abstract:
Methods and semiconductor structures are provided. A semiconductor structure according to the present disclosure includes a plurality of transistors, an interconnect structure electrically coupled to the plurality of transistors, a metal feature disposed over the interconnect structure and electrically isolated from the plurality of transistors, an insulation layer disposed over the metal feature, and a first redistribution feature and a second redistribution feature disposed over the insulation layer. A space between the first redistribution feature and the second redistribution feature is disposed directly over at least a portion of the metal feature.
Public/Granted literature
- US20230145953A1 REDUCTION OF CRACKS IN PASSIVATION LAYER Public/Granted day:2023-05-11
Information query
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