- 专利标题: Solid-state imaging apparatus and imaging apparatus including a plurality of overflow elements and storage capacitive elements
-
申请号: US17513622申请日: 2021-10-28
-
公开(公告)号: US12101568B2公开(公告)日: 2024-09-24
- 发明人: Makoto Ikuma , Hiroyuki Amikawa , Kazutoshi Onozawa
- 申请人: Nuvoton Technology Corporation Japan
- 申请人地址: JP Kyoto
- 专利权人: NUVOTON TECHNOLOGY CORPORATION JAPAN
- 当前专利权人: NUVOTON TECHNOLOGY CORPORATION JAPAN
- 当前专利权人地址: JP Kyoto
- 代理机构: Rimon P.C.
- 优先权: JP 19103378 2019.05.31
- 主分类号: H04N25/59
- IPC分类号: H04N25/59 ; H01L27/146 ; H01L27/148 ; H04N25/621 ; H04N25/75
摘要:
A solid-state imaging apparatus includes: an overflow element group that accumulates a signal charge that overflows from a photodiode; and a floating diffusion layer that selectively holds a signal charge transferred from the photodiode and a signal charge transferred from the overflow element group. The overflow element group includes m groups (m≥2) connected in series in stages, each group including an overflow element and a storage capacitive element. An overflow element among the groups transfers, to the storage capacitive element included in the same group as the overflow element, a signal charge that overflows from the photodiode or a signal charge from an upstream storage capacitive element among the groups.
信息查询