A method (400) for microscopic examination of a sample (1) includes applying (410) the sample (1) to a sample holder (10) having a transparent carrier material, capturing (420) a first image (210, 220) of the sample (1) applied to the sample holder (10) using a first light-microscopy method, cryofixing, freeze-substituting, and subsequently infiltrating and embedding (430) the sample (1) together with the sample holder (10) with an embedding medium (20) in an embedding mold (90, 100), curing (440) the embedding medium (20), removing the sample (1) from the embedding mold (90, 100) together with the embedding medium (20) and the sample holder (10), capturing (450) a second image (230) of the sample (1) embedded in the cured embedding medium (20) using a second light-microscopy method, wherein at least partially identical regions of the sample (1) are captured in the first and second images, and identifying (460) at least one portion of the first image (210, 220) and one portion of the second image (230) which show identical regions of the sample (1).