Invention Grant
- Patent Title: Time-to-digital converter circuit with self-testing function
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Application No.: US18066783Application Date: 2022-12-15
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Publication No.: US12164002B2Publication Date: 2024-12-10
- Inventor: John Kevin Moore , Gavin Stuart Ball
- Applicant: STMicroelectronics International N.V.
- Applicant Address: CH Geneva
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: CH Geneva
- Agency: Slater Matsil, LLP
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G04F10/00

Abstract:
A time-to-digital converter (TDC) circuit with self-testing function includes: a D flip-flop, where an input terminal of the D flip-flop is configured to be coupled to a data signal, and a clock terminal of the D flip-flop is configured to be coupled to a clock signal; and an AND gate, where a first input terminal of the AND gate is configured to be coupled to an enable signal of the TDC circuit, a second input terminal of the AND gate is configured to be coupled to a test signal, and an output terminal of the AND gate is coupled to a control terminal of the D flip-flop.
Public/Granted literature
- US20240201255A1 TIME-TO-DIGTIAL CONVERTER CIRCUIT WITH SELF-TESTING FUNCTION Public/Granted day:2024-06-20
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