公开(公告)号：US12164002B2

公开(公告)日：2024-12-10

申请号：US18066783

申请日：2022-12-15

Applicant: STMicroelectronics International N.V.

Inventor： John Kevin Moore ,  Gavin Stuart Ball

IPC: G01R31/317 ,  G04F10/00

Abstract: A time-to-digital converter (TDC) circuit with self-testing function includes: a D flip-flop, where an input terminal of the D flip-flop is configured to be coupled to a data signal, and a clock terminal of the D flip-flop is configured to be coupled to a clock signal; and an AND gate, where a first input terminal of the AND gate is configured to be coupled to an enable signal of the TDC circuit, a second input terminal of the AND gate is configured to be coupled to a test signal, and an output terminal of the AND gate is coupled to a control terminal of the D flip-flop.

公开(公告)号：US20240201255A1

公开(公告)日：2024-06-20

申请号：US18066783

申请日：2022-12-15

Applicant: STMicroelectronics International N.V.

Inventor： John Kevin Moore ,  Gavin Stuart Ball

IPC: G01R31/317 ,  G04F10/00

CPC classification number: G01R31/31726 ,  G01R31/31703 ,  G01R31/31727 ,  G04F10/005

Abstract: A time-to-digital converter (TDC) circuit with self-testing function includes: a D flip-flop, where an input terminal of the D flip-flop is configured to be coupled to a data signal, and a clock terminal of the D flip-flop is configured to be coupled to a clock signal; and an AND gate, where a first input terminal of the AND gate is configured to be coupled to an enable signal of the TDC circuit, a second input terminal of the AND gate is configured to be coupled to a test signal, and an output terminal of the AND gate is coupled to a control terminal of the D flip-flop.