Invention Grant
- Patent Title: Workpiece processing apparatus with thermal processing systems
-
Application No.: US18494486Application Date: 2023-10-25
-
Publication No.: US12183558B2Publication Date: 2024-12-31
- Inventor: Dixit Desai , Alex Wansidler , Dieter Hezler , Joseph Cibere , Rolf Bremensdorfer , Pete Lembesis , Michael Yang
- Applicant: Beijing E-Town Semiconductor Technology Co., Ltd. , Mattson Technology, Inc.
- Applicant Address: CN Beijing; US CA Fremont
- Assignee: Beijing E-Town Semiconductor Technology Co., Ltd.,Mattson Technology, Inc.
- Current Assignee: Beijing E-Town Semiconductor Technology Co., Ltd.,Mattson Technology, Inc.
- Current Assignee Address: CN Beijing; US CA Fremont
- Agency: Dority & Manning, P.A.
- Priority: CN202011464458.4 20201214
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
An apparatus for combining plasma processing and thermal processing of a workpiece is presented. The apparatus includes a processing chamber, a plasma chamber separated from the processing chamber disposed on a first side of the processing chamber, and a plasma source configured to generate a plasma in the plasma chamber. A quartz workpiece support is disposed within the processing chamber, the workpiece support configured to support a workpiece. One or more radiative heat sources configured to heat the workpiece are disposed on a second and opposite side of the first side of the processing chamber. A dielectric window is disposed between the workpiece support and the one or more heat sources. In addition, the apparatus includes a temperature measurement system configured to obtain a temperature measurement indicative of a temperature of the workpiece.
Public/Granted literature
- US20240055242A1 Workpiece Processing Apparatus with Thermal Processing Systems Public/Granted day:2024-02-15
Information query