Invention Grant
- Patent Title: Fault detection within an analog-to-digital converter
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Application No.: US18159305Application Date: 2023-01-25
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Publication No.: US12184297B2Publication Date: 2024-12-31
- Inventor: Veeramanikandan Raju , Anand Kumar G
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Michael T. Gabrik; Frank D. Cimino
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
A circuit includes an analog-to-digital converter (ADC) having selectable first and second analog channel inputs; a window comparator that compares a digital value output by the ADC to first and second threshold values defining a window and that asserts a trigger signal in response to the digital value being outside the window; a programmable clock circuit that provides a clock signal to the ADC; a controller that generates, in response to assertion of the trigger signal, a sample rate control signal to cause the clock circuit to increase the frequency of the clock signal and toggle selection between the first and second analog channel inputs; and comparison circuitry that compares a first digital output from the ADC to a second digital output from the ADC.
Public/Granted literature
- US20230163772A1 FAULT DETECTION WITHIN AN ANALOG-TO-DIGITAL CONVERTER Public/Granted day:2023-05-25
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