Invention Grant
- Patent Title: Semiconductor charged particle detector for microscopy
-
Application No.: US17970469Application Date: 2022-10-20
-
Publication No.: US12205792B2Publication Date: 2025-01-21
- Inventor: Yongxin Wang , Zhonghua Dong , Rui-Ling Lai , Kenichi Kanai
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Main IPC: H01J37/244
- IPC: H01J37/244 ; G01T1/24 ; H01J37/28 ; H01J37/285 ; H01L31/08

Abstract:
A detector may be provided with an array of sensing elements. The detector may include a semiconductor substrate including the array, and a circuit configured to count a number of charged particles incident on the detector. The circuit of the detector may be configured to process outputs from the plurality of sensing elements and increment a counter in response to a charged particle arrival event on a sensing element of the array. Various counting modes may be used. Counting may be based on energy ranges. Numbers of charged particles may be counted at a certain energy range and an overflow flag may be set when overflow is encountered in a sensing element. The circuit may be configured to determine a time stamp of respective charged particle arrival events occurring at each sensing element. Size of the sensing element may be determined based on criteria for enabling charged particle counting.
Public/Granted literature
- US20230123152A1 SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY Public/Granted day:2023-04-20
Information query