Invention Grant
- Patent Title: Deformation measuring device and deformation measuring method
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Application No.: US17912099Application Date: 2020-03-18
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Publication No.: US12216014B2Publication Date: 2025-02-04
- Inventor: Daiki Kobayashi , Kazuaki Watanabe , Masafumi Nakagawa , Atsushi Aratake
- Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Current Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2020/012105 WO 20200318
- International Announcement: WO2021/186641 WO 20210923
- Main IPC: G01L1/22
- IPC: G01L1/22 ; G01B7/16 ; G01L5/10 ; G01L5/102 ; G01M5/00 ; F16L11/118 ; H02G3/04
Abstract:
A strain measuring device (100) is a strain measuring device (100) for measuring strain on an FEP (10), and includes a viscous body (101) that has a lower rigidity than the FEP (10) and covers an uneven surface of the FEP (10), and a strain gauge (102) that is attached to a portion of a surface of the viscous body (101).
Public/Granted literature
- US20230041474A1 DEFORMATION MEASURING DEVICE AND DEFORMATION MEASURING METHOD Public/Granted day:2023-02-09
Information query
