Invention Grant
- Patent Title: Remapping bad blocks in a memory sub-system
-
Application No.: US18103183Application Date: 2023-01-30
-
Publication No.: US12217814B2Publication Date: 2025-02-04
- Inventor: Amit Bhardwaj
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F3/06 ; G11C29/40 ; G11C29/42 ; G11C29/44

Abstract:
Disclosed is a system that comprises a memory device comprising a plurality of memory planes and a processing device, operatively coupled with the plurality of memory planes, to perform operations that include, identifying a first block residing on a memory plane of the memory device, wherein the first block is associated with an error condition; and responsive to identifying the first block, performing an error recovery operation to replace the first block with a second block, wherein the second block resides on the memory plane.
Public/Granted literature
- US20240256132A1 REMAPPING BAD BLOCKS IN A MEMORY SUB-SYSTEM Public/Granted day:2024-08-01
Information query