An example method for detection of impurities in additive manufacturing material includes illuminating, by a light source, a sample of additive manufacturing material with light, while illuminating the sample of the additive manufacturing material with light, causing a camera to acquire image data of the sample, and processing the image data to determine an amount of impurities in the sample of the additive manufacturing material. An example system for detection of impurities in additive manufacturing material includes a light source for illuminating a sample of additive manufacturing material with light, a camera for acquiring image data of the sample while illuminating the sample of the additive manufacturing material with light, and a computing device having one or more processors configured to execute instructions stored in memory for processing the image data to determine an amount of impurities in the sample of the additive manufacturing material.