发明申请
US20030229458A1 Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
失效
用于非破坏性地检测涂层表面下的材料异常的系统和方法
- 专利标题： Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
- 专利标题（中）： 用于非破坏性地检测涂层表面下的材料异常的系统和方法
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申请号： US10455662申请日： 2003-06-05
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公开(公告)号： US20030229458A1公开(公告)日： 2003-12-11
- 发明人: Robert R. Alfano , Iosif Zeylikovich , Wubao Wang , Jamal Ali , Yury Budansky
- 申请人： RESEARCH FOUNDATION OF CUNY
- 申请人地址： NY NEW YORK
- 专利权人： RESEARCH FOUNDATION OF CUNY
- 当前专利权人： RESEARCH FOUNDATION OF CUNY
- 当前专利权人地址： NY NEW YORK
- 主分类号： G01B005/28
- IPC分类号： G01B005/28
摘要：
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
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