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    Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
    1.
    发明申请
    Systems and methods for non-destructively detecting material abnormalities beneath a coated surface 失效
    用于非破坏性地检测涂层表面下的材料异常的系统和方法

    公开(公告)号：US20030229458A1

    公开(公告)日：2003-12-11

    申请号：US10455662

    申请日：2003-06-05

    申请人： RESEARCH FOUNDATION OF CUNY

    发明人： Robert R. Alfano ,  Iosif Zeylikovich ,  Wubao Wang ,  Jamal Ali ,  Yury Budansky

    IPC分类号： G01B005/28

    CPC分类号： G01N21/88 ,  G01N21/8422 ,  G01N2021/889 ,  G01N2021/8918

    摘要： The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.

    摘要翻译： 本发明提供用于非破坏性地检测涂覆表面下方的材料异常的系统和方法，包括用于照射涂覆表面的区域并检测从涂覆表面的被照射区域反射的光的中红外（MIR）检测单元， 以及处理单元，用于从从MIR检测单元接收的光学特性产生图像。 另外，该系统还可以包括用于将MIR检测单元移动到下一个区域的扫描单元。