Invention Application
- Patent Title: Particle detection system
- Patent Title (中): 粒子检测系统
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Application No.: US10927671Application Date: 2004-08-27
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Publication No.: US20050024641A1Publication Date: 2005-02-03
- Inventor: Richard DeFreez , James Brady , Kenneth Girvin
- Applicant: Richard DeFreez , James Brady , Kenneth Girvin
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N21/53 ; G01N21/00

Abstract:
A particle detection system exhibits an increased ability to detect the presence of submicron diameter particles and to distinguish between noise and pulse output signals generated by small diameter particles on which a light beam is incident. This increased ability results from the incorporation of a light reflector, a pair of detector elements that detect correlated portions of the light beam that have been scattered in multiple directions, and a coincidence circuit that determines whether each detector element in the pair concurrently generates a pulse output signal exceeding a predetermined threshold. Sample particles are counted only when both detector elements concurrently detect scattered light components.
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