Invention Application
- Patent Title: Method of screening head based on contact recording type magnetic head and method of measuring contact force of magnetic head
- Patent Title (中): 基于接触记录型磁头的头部的测量方法和测量磁头接触力的方法
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Application No.: US10910798Application Date: 2004-08-04
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Publication No.: US20050030672A1Publication Date: 2005-02-10
- Inventor: Kan Takahashi
- Applicant: Kan Takahashi
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Priority: JP2003-290480 20030808
- Main IPC: G11B5/455
- IPC: G11B5/455 ; G11B5/02 ; G11B5/48 ; G11B5/56 ; G11B21/16 ; G11B21/21 ; G11B21/24 ; G11B25/04
Abstract:
A head gimbal assembly is prepared, a proximal end portion of a suspension therein is supported at a given mounting height above a surface of an inspection disk, and a magnetic head of the head suspension is brought into contact with the surface of the inspection disk. In this state, the inspection disk is rotated, and separation of the magnetic head from the inspection disk surface is detected with the mounting height of the suspension and/or the rotational frequency of the inspection disk changed. The mounting height and the rotational frequency of the inspection disk are converted into a contact force of the magnetic head to measure the contact force when the head is separated from the inspection disk surface.
Information query
IPC分类:
