Invention Application
- Patent Title: Low remanence flux concentrator for MRAM devices
- Patent Title (中): 用于MRAM器件的低剩磁通量集中器
-
Application No.: US10932949Application Date: 2004-09-02
-
Publication No.: US20050030786A1Publication Date: 2005-02-10
- Inventor: James Deak
- Applicant: James Deak
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16 ; H01L21/00 ; H01L27/22 ; H01L43/08

Abstract:
Systems, devices and methods are provided for magnetic memory elements with low remanence flux concentrators. Improved bit yield is attributable to reduced remanence in the flux concentrator. Remanence provides the memory element with a biasing magnetic field. The flux concentrator includes anisotropy aligned with an appropriate conductor. One aspect of the present subject matter is a memory cell. One memory cell embodiment includes a magnetic memory element and a flux concentrator operably positioned with respect to a conductor. The conductor is adapted to provide a current-induced magnetic flux to the magnetic memory element. The flux concentrator includes an easy axis of magnetization aligned with the conductor and a hard axis of magnetization orthogonal to the easy axis of magnetization. Other aspects are provided herein.
Public/Granted literature
- US07009874B2 Low remanence flux concentrator for MRAM devices Public/Granted day:2006-03-07
Information query