发明申请
US20050035296A1 Nidus position specifying system and radiation examination apparatus
审中-公开
Nidus位置指定系统和放射检查仪
- 专利标题: Nidus position specifying system and radiation examination apparatus
- 专利标题(中): Nidus位置指定系统和放射检查仪
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申请号: US10912166申请日: 2004-08-06
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公开(公告)号: US20050035296A1公开(公告)日: 2005-02-17
- 发明人: Shinichi Kojima , Yuuichirou Ueno , Kensuke Amemiya , Norihito Yanagita , Hiroshi Kitaguchi , Katsutoshi Tsuchiya , Kazuma Yokoi
- 申请人: Shinichi Kojima , Yuuichirou Ueno , Kensuke Amemiya , Norihito Yanagita , Hiroshi Kitaguchi , Katsutoshi Tsuchiya , Kazuma Yokoi
- 优先权: JP2003-291740 20030811
- 主分类号: G01R33/54
- IPC分类号: G01R33/54 ; A61B5/00 ; A61B5/055 ; A61B6/03 ; G01R33/28 ; G01T1/161 ; G06T1/00 ; G06T3/40 ; G06T7/00 ; G01T1/164
摘要:
An X-ray CT image of a low spatial resolution image is acquired by employing a PET-X-ray CT examination apparatus. Also, a PET image is acquired by employing the PET-X-ray CT examination apparatus. Furthermore, an X-ray CT image of a high spatial resolution image is acquired by employing another X-ray CT examination apparatus. Then, the X-ray CT image equal to the low spatial resolution image is corrected by employing the X-ray CT image, so that an X-ray CT image equal to a high spatial resolution image is obtained. Since a positional relationship of the resulting X-ray CT image with respect to the PET image can be grasped, this PET image can be simply synthesized with the X-ray CT image like an image.
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