发明申请
- 专利标题: Method of making a package structure by dicing a wafer from the backside surface thereof
- 专利标题(中): 通过从其背面切割晶片来制造封装结构的方法
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申请号: US10919178申请日: 2004-08-16
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公开(公告)号: US20050042844A1公开(公告)日: 2005-02-24
- 发明人: Kuo-Chung Yee
- 申请人: Kuo-Chung Yee
- 专利权人: ADVANCED SEMICONDUCTOR ENGINEERING, INC.
- 当前专利权人: ADVANCED SEMICONDUCTOR ENGINEERING, INC.
- 优先权: TW092122902 20030820
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/78
摘要:
The present invention relates to a method of making a package structure by dicing a wafer from the backside surface thereof comprising: (a) providing a first wafer having a active surface, a backside surface and a plurality of scribe lines defining a plurality of chips, wherein each chip has an annular body thereon; (b) dicing the first wafer from the active surface to form a reference coordinate; (c) providing a second wafer; (d) covering and joining the second wafer to the first wafer to form a plurality of cavities; and (e) dicing the corresponding positions of the scribe lines of the first wafer from the backside surface thereof according to the predetermined distance from the reference coordinate so as to form an individual package structure. As a result, the manufacture time is reduced.
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