发明申请
US20050068051A1 Capacitive sensor measurement method for discrete time sampled system for in-circuit test 失效
用于在线测试的离散时间采样系统的电容式传感器测量方法

  • 专利标题: Capacitive sensor measurement method for discrete time sampled system for in-circuit test
  • 专利标题(中): 用于在线测试的离散时间采样系统的电容式传感器测量方法
  • 申请号: US10672804
    申请日: 2003-09-27
  • 公开(公告)号: US20050068051A1
    公开(公告)日: 2005-03-31
  • 发明人: Curtis TesdahlRonald Peiffer
  • 申请人: Curtis TesdahlRonald Peiffer
  • 主分类号: G01R31/303
  • IPC分类号: G01R31/303 G01R31/312 G01R31/302
Capacitive sensor measurement method for discrete time sampled system for in-circuit test
摘要:
Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Respective second ends of the multiple respective nets of interest are capacitively sensed. The respective capacitively coupled signals are digitally sampled and shift correlated with respective expected digital signatures. If a high level of correlation is found for a given net, the net is electrically intact; otherwise, the net is characterized by either an open or some other fault that prevents it from meeting specification.
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