发明申请
- 专利标题: Analysis system for analysing the condition of a machine
- 专利标题(中): 分析机器状况分析系统
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申请号: US10500387申请日: 2003-01-20
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公开(公告)号: US20050071128A1公开(公告)日: 2005-03-31
- 发明人: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- 申请人: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- 优先权: SE0200147.7 20020118; SE0200215-2 20020125
- 国际申请: PCT/SE03/00081 WO 20030120
- 主分类号: G01H
- IPC分类号: G01H20060101 ; G01H1/00 ; G01H1/14 ; G01H1/16 ; G01M1/28 ; G01M7/00 ; G01M13/02 ; G01M15/04 ; G01M15/12 ; G01M99/00 ; G07C3/00 ; G07C3/08 ; G07C3/10 ; G07C9/00 ; G06F15/00
摘要:
An apparatus for analysing the condition of a machine, comprising: at least one input for receiving measurement data from a sensor for surveying a measuring point of the machine; data processing means for processing condition data dependent on said measurement data; said data processing means comprising means for performing a plurality of condition monitoring functions (F1, F2, Fn); and a logger for registering use of at least two of said condition monitoring functions (F1, F2, Fn); wherein said logger is adapted to register use of a first condition monitoring function a first rate; and said logger is adapted to register use a second condition monitoring function at a second rate.
公开/授权文献
- US07167814B2 Analysis system for analyzing the condition of a machine 公开/授权日:2007-01-23