发明申请
US20050082474A1 MEMS differential actuated nano probe and method for fabrication
失效
MEMS微分致动纳米探针和制造方法
- 专利标题: MEMS differential actuated nano probe and method for fabrication
- 专利标题(中): MEMS微分致动纳米探针和制造方法
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申请号: US10795407申请日: 2004-03-09
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公开(公告)号: US20050082474A1公开(公告)日: 2005-04-21
- 发明人: Shih-Yi Wen , Hsiao-Wen Lee , Jui-Ping Weng , Ming-Hung Chen
- 申请人: Shih-Yi Wen , Hsiao-Wen Lee , Jui-Ping Weng , Ming-Hung Chen
- 优先权: TW092128875 20031017
- 主分类号: G01Q60/18
- IPC分类号: G01Q60/18 ; G01Q60/24 ; G01Q60/46 ; G01Q60/50 ; G01Q70/16 ; G12B21/20
摘要:
A MEMS differential actuated nano probe includes four suspension beams arranged in parallel, a connecting base connecting to the suspension beams, a nano probe. Two of the suspension beams elongate due to thermal expansion to allow the deflection of the probe. By heating the suspension beams at different positions, the MEMS differential actuated nano probe can move in two directions with two degrees of freedom. The deflection of the MEMS differential actuated nano probe can be also achieved in piezoelectric or electrostatic way.
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