发明申请
- 专利标题: Epitaxial semiconductor deposition methods and structures
- 专利标题(中): 外延半导体沉积方法和结构
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申请号: US10993024申请日: 2004-11-18
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公开(公告)号: US20050092235A1公开(公告)日: 2005-05-05
- 发明人: Paul Brabant , Joseph Italiano , Chantal Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 申请人: Paul Brabant , Joseph Italiano , Chantal Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 主分类号: C30B1/00
- IPC分类号: C30B1/00 ; C30B23/00 ; C30B25/00 ; C30B25/02 ; C30B28/12 ; C30B28/14 ; C30B29/52 ; H01L21/20 ; H01L21/205 ; H01L21/36
摘要:
Methods for depositing epitaxial films such as epitaxial Ge and SiGe films. During cooling from high temperature processing to lower deposition temperatures for Ge-containing layers, Si or Ge compounds are provided to the substrate. Smooth, thin, relatively defect-free Ge or SiGe layers result. Retrograded relaxed SiGe is also provided between a relaxed, high Ge-content seed layer and an overlying strained layer.
公开/授权文献
- US07115521B2 Epitaxial semiconductor deposition methods and structures 公开/授权日:2006-10-03
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