- 专利标题: Method of forming a through-substrate interconnect
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申请号: US11012603申请日: 2004-12-14
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公开(公告)号: US20050101040A1公开(公告)日: 2005-05-12
- 发明人: Daine Lai , Samson Berhane , Barry Snyder , Ronald Hellekson , Hubert Plas
- 申请人: Daine Lai , Samson Berhane , Barry Snyder , Ronald Hellekson , Hubert Plas
- 主分类号: B41J2/16
- IPC分类号: B41J2/16 ; B81B7/00 ; H01L21/768 ; H01L23/48 ; H05K1/11 ; H01L21/66 ; G01R31/26 ; H01L21/00 ; H01L21/44
摘要:
A method of manufacturing a microelectronics device is provided, wherein the microelectronics device is formed on a substrate having a frontside and a backside. The method comprises forming a circuit element on the frontside of the substrate from a plurality of layers deposited on the frontside of the substrate, wherein the plurality of layers includes an intermediate electrical contact layer, and forming an interconnect structure after forming the electrical contact layer. The interconnect structure includes a contact pad formed on the backside of the substrate, and a through-substrate interconnect in electrical communication with the contact pad, wherein the through-substrate interconnect extends from the backside of the substrate to the electrical contact layer.
公开/授权文献
- US07432582B2 Method of forming a through-substrate interconnect 公开/授权日:2008-10-07
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