发明申请
- 专利标题: Method and system for etching a high-k dielectric material
- 专利标题(中): 蚀刻高k电介质材料的方法和系统
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申请号: US10853026申请日: 2004-05-25
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公开(公告)号: US20050118353A1公开(公告)日: 2005-06-02
- 发明人: Lee Chen , Hiromitsu Kambara , Nobuhiro Iwama
- 申请人: Lee Chen , Hiromitsu Kambara , Nobuhiro Iwama
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/311 ; H01L21/324 ; H01L21/336 ; H01L21/461 ; H05H1/24
摘要:
A method for heating a substrate between a first process and a second process using a plasma is described. The heating method comprises thermally isolating the substrate on the substrate holder by removing the backside supply of a heat transfer gas and removing the clamping force. Furthermore, an inert gas, such as a Noble gas, is introduced to the plasma processing system and a plasma is ignited. The substrate is exposed to the inert plasma for a period of time sufficient to elevate the temperature of the substrate from a first temperature (i.e., typically less than 100° C.) to a second temperature (i.e., typically of order 400° C.).
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