发明申请
- 专利标题: Local reduction of compliant thermally conductive material layer thickness on chips
- 专利标题(中): 在芯片上局部减小导热材料层厚度
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申请号: US10732015申请日: 2003-12-10
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公开(公告)号: US20050127500A1公开(公告)日: 2005-06-16
- 发明人: Evan Colgan , Claudis Feger , Gary Goth , George Katopis , John Magerlein , Edmund Sprogis
- 申请人: Evan Colgan , Claudis Feger , Gary Goth , George Katopis , John Magerlein , Edmund Sprogis
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: H01L23/34
- IPC分类号: H01L23/34 ; H01L21/50 ; H01L21/56 ; H01L23/10 ; H01L23/12 ; H01L23/36 ; H01L23/367 ; H01L23/373
摘要:
In an integrated circuit packaging structure, such as in an MCM or in a SCM, a compliant thermally conductive material is applied between a heat-generating integrated circuit chip and a substrate attached thereto. Raised regions are defined on the back side of the chip aligned to areas of a higher than average power density on the front active surface of the chip such that a thinner layer of the compliant thermally conductive material is disposed between the chip and the substrate in this area after assembly thereof resulting in a reduced “hot-spot” temperature on the chip. In an exemplary embodiment, the substrate includes one of a heat sink, cooling plate, thermal spreader, heat pipe, thermal hat, package lid, or other cooling member.
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