发明申请
- 专利标题： Testing apparatus and testing method
- 专利标题（中）： 检测仪器及检测方法
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申请号： US10824763申请日： 2004-04-14
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公开(公告)号： US20050129104A1公开(公告)日： 2005-06-16
- 发明人: Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人： Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 主分类号： G01R29/02
- IPC分类号： G01R29/02 ; G01R31/28 ; G01R31/3167 ; G01R31/317 ; G01R31/319 ; G01R31/3193 ; H04Q1/20
摘要：
A testing device for testing an electronic device is provided. The testing device includes: a deterministic jitter application unit for applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying the input signal with the deterministic jitter to the electronic device; a jitter amount controller for controlling the magnitude of the deterministic jitter generated by the deterministic jitter application unit; and a determination unit for determining whether or not the electronic device is defective based on an output signal output from the electronic device in accordance with the input signal.
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