发明申请
US20050180205A1 Magnetic random access memory and method of reading data from the same
审中-公开
磁性随机存取存储器和从其读取数据的方法
- 专利标题: Magnetic random access memory and method of reading data from the same
- 专利标题(中): 磁性随机存取存储器和从其读取数据的方法
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申请号: US11025841申请日: 2004-12-30
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公开(公告)号: US20050180205A1公开(公告)日: 2005-08-18
- 发明人: Wan-jun Park , Tae-wan Kim , Sang-jin Park , Dae-jeong Kim , Seung-jun Lee , Hyung-soon Shin
- 申请人: Wan-jun Park , Tae-wan Kim , Sang-jin Park , Dae-jeong Kim , Seung-jun Lee , Hyung-soon Shin
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2003-0100617 20031230
- 主分类号: G11C11/15
- IPC分类号: G11C11/15 ; G11C7/06 ; G11C7/14 ; G11C11/16 ; G11C11/14
摘要:
In a magnetic random access memory (MRAM), and a method of reading data from the same, the MRAM includes a memory cell having one transistor and one magnetic tunneling junction (MTJ) layer, and a reference cell that is operable for use as a basis when reading data stored in the memory cell, wherein the reference cell includes first and second MTJ layers provided in parallel to each other, and first and second transistors provided in parallel to each other, the first and second transistors being respectively connected in series to the first and second MTJ layers. Alternatively, one transistor having a driving capability corresponding to twice a driving capability of the transistor of the memory cell may be substituted for the first and second transistors of the reference cell.
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