发明申请
US20050189229A1 Method and apparatus for electroplating a semiconductor wafer 审中-公开
用于电镀半导体晶片的方法和装置

  • 专利标题: Method and apparatus for electroplating a semiconductor wafer
  • 专利标题(中): 用于电镀半导体晶片的方法和装置
  • 申请号: US11114312
    申请日: 2005-04-25
  • 公开(公告)号: US20050189229A1
    公开(公告)日: 2005-09-01
  • 发明人: James Powers
  • 申请人: James Powers
  • 主分类号: C25D7/12
  • IPC分类号: C25D7/12 C25D11/32 C25D17/10 C25D17/12 H01L21/288
Method and apparatus for electroplating a semiconductor wafer
摘要:
A method, apparatus and anode for plating copper or other metals onto a barrier or seed layer of a wafer surface is described. A copper layer of uniform thickness is plated on the surface by, for instance, maintaining a constant current density between the anode and wafer surface. Several configurations of anodes are described for obtaining the constant current density.
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