Invention Application
- Patent Title: Methods of forming a capacitor using an atomic layer deposition process
- Patent Title (中): 使用原子层沉积工艺形成电容器的方法
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Application No.: US11065086Application Date: 2005-02-24
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Publication No.: US20050208718A1Publication Date: 2005-09-22
- Inventor: Jae-Soon Lim , Sung-Tae Kim , Young-Sun Kim , Young-Geun Park , Suk-Jin Chung , Seung-Hwan Lee
- Applicant: Jae-Soon Lim , Sung-Tae Kim , Young-Sun Kim , Young-Geun Park , Suk-Jin Chung , Seung-Hwan Lee
- Priority: KR10-2004-17503 20040316
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/02 ; H01L21/285 ; H01L21/314 ; H01L21/469 ; H01L21/8242

Abstract:
Methods for forming a capacitor using an atomic layer deposition process include providing a reactant including an aluminum precursor onto a substrate to chemisorb a portion of the reactant to a surface of the substrate. The substrate has an underlying structure including a lower electrode. An ammonia (NH3) plasma is provided onto the substrate to form a dielectric layer including aluminum nitride on the substrate including the lower electrode. An upper electrode is formed on the dielectric layer. A second dielectric layer may be provided oil the first dielectric layer
Public/Granted literature
- US07361548B2 Methods of forming a capacitor using an atomic layer deposition process Public/Granted day:2008-04-22
Information query
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