Invention Application
US20050208718A1 Methods of forming a capacitor using an atomic layer deposition process 有权
使用原子层沉积工艺形成电容器的方法

Methods of forming a capacitor using an atomic layer deposition process
Abstract:
Methods for forming a capacitor using an atomic layer deposition process include providing a reactant including an aluminum precursor onto a substrate to chemisorb a portion of the reactant to a surface of the substrate. The substrate has an underlying structure including a lower electrode. An ammonia (NH3) plasma is provided onto the substrate to form a dielectric layer including aluminum nitride on the substrate including the lower electrode. An upper electrode is formed on the dielectric layer. A second dielectric layer may be provided oil the first dielectric layer
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