发明申请
US20050211544A1 Electrical biasing of gas introduction means of plasma apparatus 审中-公开
等离子体装置气体导入装置的电气偏置

Electrical biasing of gas introduction means of plasma apparatus
摘要:
A method of treating or processing at least one substrate/workpiece in a plasma comprises steps of: (a) providing an apparatus comprising a chamber defining an interior space; (b) mounting/positioning at least one substrate/workpiece in the interior space; (c) injecting gas(es) into the interior space by means of an electrically isolated gas supply means having at least one outlet orifice; (d) generating a plasma in the interior space; (e) applying a bias potential to the gas supply means to suppress plasma formation at the at least one outlet orifice; and (f) treating/processing the at least one substrate/workpiece in the plasma.
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