发明申请
- 专利标题: Jitter measuring apparatus and a testing apparatus
- 专利标题(中): 抖动测量仪和测试仪
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申请号: US11097102申请日: 2005-04-01
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公开(公告)号: US20050218881A1公开(公告)日: 2005-10-06
- 发明人: Kouichi Tanaka , Hirokatsu Niijima
- 申请人: Kouichi Tanaka , Hirokatsu Niijima
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JPJP2002-288799 20021001
- 主分类号: G01R29/02
- IPC分类号: G01R29/02 ; G01R29/26 ; G01R31/28 ; G01R31/317 ; G01R31/3183 ; G01R31/319 ; G01R19/00 ; G01R25/00 ; H03D13/00
摘要:
A jitter measuring apparatus for measuring jitter of an output signal output by an electronic device is provided, wherein the jitter measuring apparatus includes a multi-strobe generating unit for generating multi-strobe having more than or equal to three (3) strobes a plurality of times synchronously with the output signal output a plurality of times by the electronic device, a value detecting unit for detecting a value of the output signal for each strobe of the multi-strobe generated a plurality of times by the multi-strobe generating unit, a transition point detecting unit for detecting the position of a transition point of the value of each output signal on the basis of the value of the output signal detected by the value detecting unit, and a histogram generating unit for counting how many times the transition point detecting unit detects the transition point at every position of the transition point of the value of the output signal.
公开/授权文献
- US07002334B2 Jitter measuring apparatus and a testing apparatus 公开/授权日:2006-02-21
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