发明申请
US20050225905A1 Tunnel magnetoresistance device 失效
隧道磁阻器件

Tunnel magnetoresistance device
摘要:
The TMR device has a structure including a lower electrode layer, a pinned layer, a tunnel barrier layer, a free layer, and an upper electrode layer which are successively formed on a substrate. The tunnel barrier layer has substantially a stoichiometric composition. The tunnel barrier layer may be a thin film of an oxide of AL formed by ALD method.
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