发明申请
- 专利标题: Method for selection of optical fiber and system for inspection of optical fiber
- 专利标题(中): 光纤选择方法及光纤检测系统
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申请号: US11184924申请日: 2005-07-20
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公开(公告)号: US20050248751A1公开(公告)日: 2005-11-10
- 发明人: Shinji Endo , Yoshiaki Nagao , Toshiyuki Yamamoto , Toshio Oshima
- 申请人: Shinji Endo , Yoshiaki Nagao , Toshiyuki Yamamoto , Toshio Oshima
- 申请人地址: JP Osaka
- 专利权人: SUMITOMO ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: SUMITOMO ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人地址: JP Osaka
- 优先权: JPP2002-084001 20020325; JPP2002-084012 20020325; JPP2002-099126 20020401
- 主分类号: G01M11/00
- IPC分类号: G01M11/00 ; G01N21/00
摘要:
An optical fiber inspecting system 1A comprises a waveform measuring unit 2 for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit 3 for evaluating an anomaly within the optical fiber through a use of the measured waveform. Furthermore, the waveform evaluating unit 3 comprises a calculating part 4 and a detecting part 5. The calculating part 4 calculates the gradient and the amount of change in gradient of the waveform at each time point by means of a gradient calculating section 41 and a gradient change amount calculating section 42. The detecting part 5 determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively, by means of a gradient determining section 51 and a gradient change amount determining section 52. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.
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