发明申请
US20050253286A1 Epoxy resin composition for semiconductor encapsulation, semiconductor device using the same, and process for producing semiconductor device
失效
用于半导体封装的环氧树脂组合物,使用该环氧树脂组合物的半导体器件,以及半导体器件的制造方法
- 专利标题: Epoxy resin composition for semiconductor encapsulation, semiconductor device using the same, and process for producing semiconductor device
- 专利标题(中): 用于半导体封装的环氧树脂组合物,使用该环氧树脂组合物的半导体器件,以及半导体器件的制造方法
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申请号: US11115307申请日: 2005-04-27
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公开(公告)号: US20050253286A1公开(公告)日: 2005-11-17
- 发明人: Keisuke Yoshikawa , Kazuhito Hosokawa , Takuji Okeyui , Kazuhiro Ikemura
- 申请人: Keisuke Yoshikawa , Kazuhito Hosokawa , Takuji Okeyui , Kazuhiro Ikemura
- 专利权人: NITTO DENKO CORPORATION
- 当前专利权人: NITTO DENKO CORPORATION
- 优先权: JPP.2004-136137 20040430; JPP.2004-229715 20040805
- 主分类号: C08G59/00
- IPC分类号: C08G59/00 ; C08G59/62 ; C08G59/68 ; C08L63/00 ; C09J163/00 ; H01L21/48 ; H01L21/56 ; H01L23/29 ; H01L23/31 ; H01L23/495
摘要:
An epoxy resin composition for semiconductor encapsulation in producing surface mount lead-less thin semiconductor devices. The epoxy resin composition for surface mount lead-less semiconductor device encapsulation which device comprising an encapsulating resin layer and, encapsulated therein, a substrate, a semiconductor element mounted on the substrate, two or more conductive parts disposed around the semiconductor element, and wires which electrically connect electrodes of the semiconductor element to the conductive parts, wherein the bottom face of the substrate and the bottom face of each conductive part are exposed without being encapsulated in the encapsulating resin layer, and the epoxy resin composition used for forming the encapsulating resin layer has the following properties (α) and (β): (α) a melt viscosity of 2-10 Pa.s at 175° C.; and (β) a flexural strength of cured state of 130 MPa or higher at ordinary temperature.
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