发明申请
US20060013551A1 Symmetrization structures for process-tolerant integrated optical components
审中-公开
用于过程容差集成光学元件的对称结构
- 专利标题: Symmetrization structures for process-tolerant integrated optical components
- 专利标题(中): 用于过程容差集成光学元件的对称结构
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申请号: US11146968申请日: 2005-06-07
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公开(公告)号: US20060013551A1公开(公告)日: 2006-01-19
- 发明人: James Foresi , Tairan Wang , Jean-Francois Viens , Dale Fried , Mohammad Khan , Michael Lim , Anuradha Agarwal , Gokhan Ulu
- 申请人: James Foresi , Tairan Wang , Jean-Francois Viens , Dale Fried , Mohammad Khan , Michael Lim , Anuradha Agarwal , Gokhan Ulu
- 主分类号: G02B6/10
- IPC分类号: G02B6/10
摘要:
An integrated planar waveguide system including at least two primary waveguides for light propagation and coupling, and two or more mirror-imaged symmetrization structures in close proximity to the primary waveguides in order to provide micro-process-equalization during etch, growth, annealing and reflow processes. The primary waveguides are designed to carry light signals. The symmetrization waveguide structures are designed so that all the trenches between primary waveguides are identical to the desired degree. At the same time, the symmetrization structures are designed to have minimal detrimental impact on the optical performance of the coupler.
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