发明申请
- 专利标题: Enhanced signal observability for circuit analysis
- 专利标题(中): 电路分析增强的信号可观测性
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申请号: US10912493申请日: 2004-08-05
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公开(公告)号: US20060028219A1公开(公告)日: 2006-02-09
- 发明人: Chandler McDowell , Stanislav Polonsky , Peilin Song , Franco Stellari , Alan Weger
- 申请人: Chandler McDowell , Stanislav Polonsky , Peilin Song , Franco Stellari , Alan Weger
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G06K9/00
摘要:
Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.
公开/授权文献
- US07355419B2 Enhanced signal observability for circuit analysis 公开/授权日:2008-04-08
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