- 专利标题: X-ray diagnosis apparatus and method for obtaining an X-ray image
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申请号: US11257091申请日: 2005-10-25
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公开(公告)号: US20060034424A1公开(公告)日: 2006-02-16
- 发明人: Takuya Sakaguchi , Akira Tsukamoto
- 申请人: Takuya Sakaguchi , Akira Tsukamoto
- 申请人地址: JP Minato-ku
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Minato-ku
- 优先权: JP2003-035569 20030213
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
A method for obtaining an X-ray image for an X-ray diagnosis apparatus including plurality of imaging systems, including: collecting first scatter data using a first X-ray detector after an X-ray is irradiated from a first X-ray tube in a first imaging system; collecting second scatter data using a second X-ray detector after an X-ray is irradiated from a second X-ray tube in a second imaging system; collecting first image data including a scatter component using X-ray detectors after an X-ray is irradiated from a third X-ray tube in the first imaging system; collecting second image data including a scatter component using X-ray detectors after an X-ray is irradiated from a fourth X-ray tube in the second imaging system; and obtaining X-ray images for the first and second imaging systems by subtracting the first and second scatter data from the first and second image data including a scatter component, respectively.
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