发明申请
US20060156134A1 Programmable memory built-in-self-test (MBIST) method and apparatus
有权
可编程存储器内置自检（MBIST）方法和装置
- 专利标题： Programmable memory built-in-self-test (MBIST) method and apparatus
- 专利标题（中）： 可编程存储器内置自检（MBIST）方法和装置
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申请号： US11283527申请日： 2005-11-18
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公开(公告)号： US20060156134A1公开(公告)日： 2006-07-13
- 发明人: Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
- 申请人： Nilanjan Mukherjee , Xiaogang Du , Wu-Tung Cheng
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.
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