发明申请
- 专利标题： Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device
- 专利标题（中）： 抖动测量装置，抖动测量方法，测试装置和电子装置
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申请号： US11378407申请日： 2006-03-17
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公开(公告)号： US20060182170A1公开(公告)日： 2006-08-17
- 发明人: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人： Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 主分类号： H04B17/00
- IPC分类号： H04B17/00
摘要：
A jitter measuring apparatus for measuring timing jitter of a signal-under-test is provided, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
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