摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
摘要:
A jitter measuring apparatus for measuring timing jitter of a signal-under-test is provided, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
摘要:
A jitter measuring apparatus measures timing jitter of a signal-under-test. The jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
There is provided a phase difference detecting apparatus operable to detect the phase difference between a first input signal and a second input signal. The phase detecting apparatus includes: a first divider operable to generate a first divided signal, which is the first input signal divided by two, so that all rising edges of the first input signal correspond to a rising edge and a falling edge of the first divided signal; a second divider operable to generate a second divided signal, which is the second input signal divided by two, so that the first divided signal corresponds to edges; a first phase detector operable to detect a phase difference between a rising edge of the first divided signal and an edge corresponding to the rising edge in the second divided signal; and a second phase detector operable to detect a phase difference between a falling edge of the first divided signal and an edge corresponding to the falling edge in the second divided signal.
摘要:
There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section that calculates a spectrum of the probability density function on an axis of a predetermined variable, a null value detecting section that detects a null value on the axis of the predetermined variable in the calculated spectrum, a theoretical value calculating section that calculates a theoretical value of a spectrum of the deterministic component in association with each of a plurality of predetermined deterministic component types, based on the null value detected by the null value detecting section, and a model determining section that determines, as the type of the deterministic component contained in the probability density function, a deterministic component type associated with a logarithmic magnitude spectrum difference most similar to a logarithmic magnitude spectrum of a Gaussian distribution, where the logarithmic magnitude spectrum difference is produced by subtracting the theoretical value of the spectrum of the deterministic component calculated in association with each of the plurality of predetermined deterministic component types from the spectrum calculated by the spectrum calculating section.
摘要:
Provided is a deterministic component model determining apparatus that determines a type of a deterministic component included in a probability density function supplied thereto, comprising a standard deviation calculating section that calculates a standard deviation of the probability density function; a spectrum calculating section that calculates a spectrum of the probability density function; a null frequency detecting section that detects a null frequency of the spectrum; a theoretical value calculating section that calculates a theoretical value of a spectrum for each of a plurality of predetermined types of deterministic components, based on the null frequency; a measured value calculating section that calculates a measured value of the spectrum for the deterministic component included in the probability density function, based on the standard deviation and the spectrum; and a model determining section that determines the type of the deterministic component included in the probability density function to be the type of deterministic component corresponding to a theoretical value closest to the measured value, from among the theoretical values for the plurality of types of deterministic components.
摘要:
A deterministic component identifying apparatus identifies a distribution shape of a deterministic component included in a probability density function supplied thereto. The apparatus includes a standard deviation calculating section that calculates a standard deviation of the probability density function, a spectrum calculating section that calculates a spectrum of the probability density function, a null frequency detecting section that detects a null frequency of the spectrum, and a ratio calculating section that calculates a ratio between a top portion and a bottom portion of a distribution of the deterministic component, based on the standard deviation of the probability density function and the null frequency of the spectrum.