发明申请
- 专利标题: Deposition methods
- 专利标题(中): 沉积方法
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申请号: US11490622申请日: 2006-07-21
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公开(公告)号: US20060257570A1公开(公告)日: 2006-11-16
- 发明人: Garo Derderian , Gurtej Sandhu
- 申请人: Garo Derderian , Gurtej Sandhu
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
A deposition method includes contacting a substrate with a first initiation precursor and forming a first portion of an initiation layer on the substrate. At least a part of the substrate is contacted with a second initiation precursor different from the first initiation precursor and a second portion of the initiation layer is formed on the substrate. The substrate may be simultaneously contacted with a plurality of initiation precursors, forming on the substrate and initiation layer comprising components, derived from each of the plurality of initiation precursors. An initiation layer may be contacted with a deposition precursor, forming a deposition layer on the initiation layer. The deposition layer may be contacted with a second initiation precursor different from the first initiation precursor forming a second initiation layer over the substrate. Also, a first initiation layer may be formed substantially selectively on a first-type substrate surface relative to a second-type substrate surface and contacted with a deposition precursor, forming a deposition layer substantially selectively over the first-type substrate surface.
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