Invention Application
- Patent Title: Apparatus for measuring jitter and method of measuring jitter
-
Application No.: US11137786Application Date: 2005-05-25
-
Publication No.: US20060268970A1Publication Date: 2006-11-30
- Inventor: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- Applicant: Kiyotaka Ichiyama , Masahiro Ishida , Takahiro Yamaguchi , Mani Soma
- Applicant Address: JP Tokyo 179-0071 US WA Seattle 98177-4611
- Assignee: Advantest Corporation,Mani Soma
- Current Assignee: Advantest Corporation,Mani Soma
- Current Assignee Address: JP Tokyo 179-0071 US WA Seattle 98177-4611
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
Public/Granted literature
- US07496137B2 Apparatus for measuring jitter and method of measuring jitter Public/Granted day:2009-02-24
Information query