发明申请
- 专利标题: Semiconductor device and method of manufacturing the same
- 专利标题(中): 半导体装置及其制造方法
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申请号: US11498168申请日: 2006-08-03
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公开(公告)号: US20060270123A1公开(公告)日: 2006-11-30
- 发明人: Tatsuya Arao , Hideomi Suzawa
- 申请人: Tatsuya Arao , Hideomi Suzawa
- 申请人地址: JP Atsugi-shi 243-0036
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi 243-0036
- 优先权: JP2000-140592 20000512
- 主分类号: H01L21/84
- IPC分类号: H01L21/84 ; H01L21/00
摘要:
To realize the reduction of a manufacturing cost and the enhancement of yield by reducing the number of steps of a TFT in an electro-optical device typified by an active matrix liquid crystal display device. A semiconductor device of the present invention is characterized by including a first wiring and a second wiring formed of a first conductive film on the same insulating surface, a first semiconductor film of one conductivity type formed on the first and second wirings so as to correspond thereto, a second semiconductor film formed on an upper layer of the first semiconductor film of one conductivity type across the first wiring and the second wiring, an insulating film formed on the second semiconductor film, and a third conductive film formed on the insulating film.
公开/授权文献
- US07335597B2 Semiconductor device and method of manufacturing the same 公开/授权日:2008-02-26
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