发明申请
US20060274325A1 Method of qualifying a diffraction grating and method of manufacturing an optical element 审中-公开
限定衍射光栅的方法和制造光学元件的方法

Method of qualifying a diffraction grating and method of manufacturing an optical element
摘要:
A method of qualifying a diffraction grating comprises performing plural measurements by illuminating a region of the grating with a beam of measuring light and detecting an intensity of measuring light diffracted by the grating into a 0th diffraction order. A wavelength of the measuring light or a polarization of the measuring light or an angle of incidence of the measuring light onto the diffraction grating is varied between subsequent measurements. A shape parameter of diffracting elements forming the grating comprises a pitch, height or width of structural features of the diffracting elements. The shape parameter is advantageously used in analyzing interferometric measurements performed on optical surfaces during manufacture of optical elements of a high accuracy.
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