- 专利标题: Lithographic apparatus and cleaning method therefor
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申请号: US11150466申请日: 2005-06-13
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公开(公告)号: US20060278833A1公开(公告)日: 2006-12-14
- 发明人: Maarten Marinus Wilhelmus Van Herpen , Vadim Banine , Derk Klunder
- 申请人: Maarten Marinus Wilhelmus Van Herpen , Vadim Banine , Derk Klunder
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 主分类号: G21K5/10
- IPC分类号: G21K5/10
摘要:
A lithographic apparatus is disclosed. The apparatus includes a source for supplying hydrogen radicals, a guide for use in conjunction with the source, for directing hydrogen radicals to an application surface to be targeted by the hydrogen radicals. The guide is provided with a coating having a hydrogen radical recombination constant of less than 0.2. In this way, the radicals can be transported with reduced losses and are able to better interact with remaining contaminants on application surfaces, such as mirror surfaces.
公开/授权文献
- US07750326B2 Lithographic apparatus and cleaning method therefor 公开/授权日:2010-07-06
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